Influence of surface roughness on polarization property in passive millimeter-wave imaging

IEICE Electronics Express

Xinyi Zhang¹  Mengting Song¹  Fei Hu²  Yayun Cheng²  Ying Xiao² 

[1] National Key Laboratory of Science and Technology on Multi-Spectral Information Processing;School of Electronic Information and Communications, Huazhong University of Science and Technology

关键词: millimeter-wave;    passive imaging;    polarimetric measurement;    rough surface;    linear polarization ratio;    material classification;   

DOI  :  10.1587/elex.14.20171005

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

Polarimetric measurement can gain more object information when compared to traditional methods. Linear polarization ratio (LPR) of the millimeter-wave thermal emission has been presented recently and proved to be effective in material classification. The LPR classification technique can be used for the metal detection in the soil and concrete ground. The roughness has not been considered in analysing LPR properties and it may affect the classification performance. In this paper, we focus on the influence of surface roughness on LPR. By solving scattering problem, the LPR properties of different roughness parameters are investigated. Theoretical calculations indicate that the LPR value decreases with the increasing of surface roughness. In addition, the applicable scope of LPR classification technique to discriminate rough surfaces is discussed.

【 授权许可】

CC BY