Bulletin of Materials Science | |
Helium implanted $\rm\underline{Al}$Hf as studied by 181Ta TDPAC | |
关键词: TDPAC; electric field gradient; Hf solute clusters; helium-vacancy complex; defect recovery.; | |
学科分类:材料工程 | |
来源: Indian Academy of Sciences | |
【 摘 要 】
Time differential perturbed angular correlation (TDPAC) measurement on $\rm\underline{Al}$Hf reference sample has shown that a fraction 0.88 of probe nuclei are defect free and are occupying the substitutional sites in fcc Al matrix, and the remaining are associated with Hf solute clusters. Measurements on helium implanted sample indicate the binding of helium associated defects by Hf solute clusters. Isochronal annealing measurements indicate the dissociation of the helium implantation induced defects from Hf solute clusters for annealing treatments beyond 650 K. On comparison of the present results with that reported in $\rm\underline{Cu}$Hf subjected to identical helium implantation, it is inferred that the Hf solute clusters in $\rm\underline{Al}$Hf bind less strongly the helium associated defects than in $\rm\underline{Cu}$Hf.
【 授权许可】
CC BY
【 预 览 】
Files | Size | Format | View |
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RO201902189826804ZK.pdf | 218KB | download |