Serial snapshot crystallography for materials science with SwissFEL

IUCrJ

Tamura, N.¹  Abela, R.²  Smeets, S.³  Dejoie, C.³  Baerlocher, C.³  Pattison, P.⁴  McCusker, L.B.⁵ 

[1] Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA;Laboratory of Crystallography, EPFL, Rte de la Sorge, Lausanne, 1015, Switzerland;Laboratory of Crystallography, ETH Zurich, Vladimir-Prelog-Weg 5, Zurich, 8093, Switzerland;Swiss-Norwegian Beamlines, European Synchrotron Radiation Facility, 71 avenue des Martyrs, Grenoble, 38042, France;SwissFEL, Paul Scherrer Institut, Villigen PSI, 5232, Switzerland

关键词: SERIAL SNAPSHOT CRYSTALLOGRAPHY;    MULTI-MICROCRYSTAL DIFFRACTION;    INDEXING;    BROAD-BANDPASS BEAM;    XFEL;   

DOI  :  10.1107/S2052252515006740

学科分类：数学（综合）

来源: International Union of Crystallography

【 摘 要 】

New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-energy-bandpass mode of the SwissFEL beam show that it will be possible to record a diffraction pattern of up to 10 randomly oriented crystals in a single snapshot, to index the resulting reflections, and to extract their intensities reliably. The crystals are destroyed with each XFEL pulse, but by combining snapshots from several sets of crystals, a complete set of data can be assembled, and crystal structures of materials that are difficult to analyze otherwise will become accessible. Even with a single shot, at least a partial analysis of the crystal structure will be possible, and with 10–50 femtosecond pulses, this offers tantalizing possibilities for time-resolved studies.

【 授权许可】

CC BY