Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy

Bulletin of the Polish Academy of Sciences. Technical Sciences

A. MogilatenkoInstitute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar¹  W. HetabaInstitute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar¹  W. NeumannInstitute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar¹  H. KirmseInstitute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar¹  I. HäuslerInstitute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar¹  Ch. ZhengInstitute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, GermanyOther articles by this author:De Gruyter OnlineGoogle Scholar¹ 

[1]Institute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, Germany

关键词: Keywords: electron microscopy;    energy dispersive X-ray spectroscopy;    electron energy-loss spectroscopy;    electron holography;    Lorentz microscopy;    interface analysis;   

DOI  :  10.2478/v10175-010-0023-5

学科分类：工程和技术（综合）

来源: Polska Akademia Nauk * Centrum Upowszechniania Nauki / Polish Academy of Sciences, Center for the Advancement of Science

【 摘 要 】

Transmission electron microscopy (TEM) is a powerful diagnostic tool for the determination of structure/property relationships of materials. A comprehensive analysis of materials requires a combined use of a variety of complementary electron microscopical techniques of imaging, diffraction and spectroscopy at an atomic level of magnitude. The possibilities and limitations of quantitative TEM analysis will be demonstrated for interface studies of the following materials and materials systems: Nickel-based superalloy CMSX-10, (Zn, Cd)O/ZnO/Al2O3, (Al, Ga)N/AlN/Al2O3, GaN/LiAlO2 and FeCo-based nanocrystalline alloys.

【 授权许可】

Unknown