De-noising algorithm for enhancing microwave imaging

The Journal of Engineering

Denys S. Shumakov¹  Alexander S. Beaverstone¹  Natalia K. Nikolova¹ 

[1] Department of Electrical and Computer Engineering, McMaster University, Hamilton, Canada

关键词: measurement uncertainty;    data collection;    image enhancement;    iterative procedure;    complex S-parameter frequency-sweep data denoising;    empirical mode decomposition;    microwave imaging;    signal component estimation;    image denoising;    surface acquisition;   

DOI  :  10.1049/joe.2016.0207

学科分类：工程和技术（综合）

来源: IET

【 摘 要 】

An algorithm for the de-noising of S-parameter data used in microwave imaging is proposed. The complex S-parameter frequency-sweep data are collected through scans over an acquisition surface and the algorithm separates efficiently the resulting two-dimensional responses (one frequency at a time) into a signal and a noise component. The separation is performed with an iterative procedure similar to the empirical mode decomposition. The signal component estimates the noise-free data, whereas the remaining data content estimates the noise and uncertainty in the measurement. The algorithm performance is verified with measured data.

【 授权许可】

CC BY