Pattern recognition technique for integrated circuit (IC) pins inspection using wavelet transform with chain-code-discrete fourier transform and signal correlation

International Journal of Physical Sciences

Somyot Kaitwanidvilai¹ 

关键词: Classification technique;    feature extraction;    visual inspection;    image processing.;   

DOI  :  10.5897/IJPS11.1434

学科分类：物理（综合）

来源: Academic Journals

【 摘 要 】

This paper proposes a new technique for recognizingintegrated circuit (IC) pins in an IC chip. The proposed technique applies the wavelet transform and discrete Fourier’s transform to extract the interesting features for classifying the IC pin pattern. The accuracy and inspection time of the proposed method are investigated by comparing with other pattern recognition techniques such as full template matching, coarse to fine method, etc. 40 images are adopted to test the effectiveness of the proposed algorithm. As seen in the results of classification of images with 5 degrees rotation, the proposed method gains the average maximum cross correlation of 0.9986 with the standard deviation of 0.0004. Experimental results show the effectiveness of the proposed method which is better than the other conventional techniques.

【 授权许可】

CC BY