期刊论文详细信息
Active and Passive Electronic Components
Using Spice Circuit Simulation Program in Reliability Analysis ofRedundant Systems with Non-Repairable Units and Common-CauseFailures
Isa Salman Qamber2  Muhammad Taher Abuelma'atti1 
[1] King Fahd University of Petroleum and Minerals, Box 203, Dhahran 31261, Saudi Arabia, kfupm.edu.sa;University of Bahrain, P.O. Box 32038, Isa Town, Bahrain, uob.edu.bh
关键词: SPICE simulation;    Reliability;   
Others  :  1369311
DOI  :  10.1155/2000/85913
 received in 1999-11-10, accepted in 2000-01-28,  发布年份 2000
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【 摘 要 】

The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit for N parallel units are presented. Results obtained, for N=1,2,3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.

【 授权许可】

   
Copyright © 2000 Hindawi Publishing Corporation 2000

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