Statistical Modeling of 3-D Parallel-Plate Embedded Capacitors Using Monte Carlo Simulation

ETRI Journal

关键词: Monte Carlo Analysis;    Embedded Passive Components;    Multichip Modules;   

Others  :  1184456
DOI  :  10.4218/etrij.01.0101.0104

【 摘 要 】

Examination of the statistical variation of integrated passive components is crucial for designing and characterizing the performance of multichip module (MCM) substrates. In this paper, the statistical analysis of parallel plate capacitors with gridded p

   

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