| ETRI Journal | |
| A Built-In Redundancy Analysis with a Minimized Binary Search Tree | |
| 关键词: binary search tree; repair efficiency; BIRA; | |
| Others : 1185930 DOI : 10.4218/etrij.10.0210.0032 |
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【 摘 要 】
With the growth of memory capacity and density, memory testing and repair with the goal of yield improvement have become more important. Therefore, the development of high efficiency redundancy analysis algorithms is essential to improve yield rate. In this letter, we propose an improved built-in redundancy analysis (BIRA) algorithm with a minimized binary search tree made by simple calculations. The tree is constructed until finding a solution from the most probable branch. This greatly reduces the search spaces for a solution. The proposed BIRA algorithm results in 100% repair efficiency and fast redundancy analysis.
【 授权许可】
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 20150520115839389.pdf | 178KB |
【 参考文献 】
- [1]Y. Park et al., "An Effective Test and Diagnosis Algorithm for Dual-Port Memories," ETRI J., vol. 30, no. 4, Aug. 2008, pp. 555-564.
- [2]T. Kawagoe et al., "A Built-in Self-Repair Analyzer (CRESTA) for Embedded DRAMs," Proc. Int. Test Conf. (ITC), 2000, pp. 567-574.
- [3]P. Öhler, S. Hellebrand, and H.J. Wunderlich, "An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy," Proc. European Test Symp. (ETS), May. 2007, pp. 91-96.
- [4]C.T. Huang et al., "Built-In Redundancy Analysis for Memory Yield Improvement," IEEE Trans. Reliab., vol. 52, Dec. 2003, pp. 386-399.
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