On the New Design of a 4-Port TEM Waveguide with a Higher Cutoff Frequency and Wider Test Volume

ETRI Journal

关键词: far-field environment;    cutoff frequency;    field uniformity;    EMC test;    TEM waveguide;   

Others  :  1186352
DOI  :  10.4218/etrij.12.0212.0022

【 摘 要 】

A new miniaturized 4-port waveguide generating a transverse electromagnetic wave is proposed. The waveguide presents enhanced performance of higher field uniformity in extended test volume up to an increased test frequency limit compared to that of the conventional 2-port waveguide. The advantageous features of the proposed waveguide have been obtained through a new design scheme based on effective miniaturization maintaining good impedance matching. Consequently, we can provide a more accurate electromagnetic compatibility test method, covering larger devices operating in higher frequencies, which is a marked improvement upon the conventional approaches.

   

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