| Active and Passive Electronic Components | |
| Reliability and Availability Analysis of Some Systems with Common-Cause Failures Using SPICE Circuit Simulation Program | |
| Isa Salman Qamber2  Muhammad Taher Abuelma'atti1  | |
| [1] King Fahd University of Petroleum and Minerals, Box 203, Dhahran 31261, Saudi Arabia, kfupm.edu.sa;University of Bahrain, P.O. Box 32038, Isa Town, Bahrain, uob.edu.bh | |
| 关键词: SPICE simulation; availability; Reliability; | |
| Others : 1369294 DOI : 10.1155/1999/12147 |
|
| received in 1998-08-31, accepted in 1998-12-03, 发布年份 1998 | |
PDF
|
|
【 摘 要 】
The effectiveness of SPICE circuit simulation program in calculating probabilities, reliability, steady-state availability and mean-time to failure of repairable systems described by Markov models is demonstrated. Two examples are presented. The first example is a warm standby system with common-cause failures and human errors. The second example is a non-identical unit parallel system with common-cause failures. In both cases recourse to numerical solution is inevitable to obtain the Laplace transforms of the probabilities. Results obtained using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.
【 授权许可】
Copyright © 1999 Hindawi Publishing Corporation 1999
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 012147.pdf | 960KB |
PDF