High Precision Digital Inclinometer Based on Over Sampling Theory

2018 3rd International Conference on Insulating Materials, Material Application and Electrical Engineering

材料科学;无线电电子学;电工学

Chen, Jun^1

Physics and Electronic Information College, Luoyang Normal University, Luoyang

471022, China^1

关键词: inclinometer;    Low-power consumption;    Measuring instruments;    Micro accelerometers;    Over sampling;    Sampling algorithm;    Single chip computers;    Standard deviation;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/452/4/042036/pdf
DOI  :  10.1088/1757-899X/452/4/042036

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

A kind of high precision digital inclinometer is designed based on over sampling theory. The analog signal micro accelerometer FXLN8361 as the measure component, and the single chip computer with high performance and low power consumption MSP430F5529 from TI is used as controller. The incline of side is detected by the double axis measurement, so that the constant of incidence sensitivity could be achieved. The over sampling theory is designed. After the experimental results were analyzed by linear fitting, it is concluded that the measuring instrument has used the sampling algorithm; the minimum measured angle could be increased from 0.8° to 0.05°. We get the standard deviation of the slope of the measurement curve: 5.2993×10-5, the standard deviation of intercept was 0.00277; linear error was less than 0.00525%. The results show that the inclinometer was with high precision, and the structure was rational and feasible.