An Experimental Method on the EMP Resistance of QLED Device

2018 3rd International Conference on Insulating Materials, Material Application and Electrical Engineering

材料科学;无线电电子学;电工学

Zhao, Mo^1 ; Wu, Wei^1 ; Cheng, Yinhui^1 ; Li, Jinxi^1 ; Ma, Liang^1 ; Liu, Yifei^1 ; Guo, Jinghai^1 ; Wang, Wenbing^1 ; Wang, Xutong^1

State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi an, China^1

关键词: Coupling energies;    Engineering practices;    Experiment methods;    Experimental methods;    Interference waves;    Irradiation experiments;    Pulse voltage;    Quantum-dot light emitting diodes;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/452/4/042178/pdf
DOI  :  10.1088/1757-899X/452/4/042178

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

An experimental method on the electromagnetic pulse resistance of quantum dot light-emitting diode device is researched in this paper. If there is a strong electromagnetic pulse in the environment, the electromagnetic pulse can disturb the QLED device's work or even destroy it through coupling into the cables of the device. The noises could overwhelm the interference wave if using irradiation experiment. So, the equivalent coupling energy is calculated, and the pulse voltage injection experiment method is adopt in this paper. The experiment results supply references to the engineering practice.