Electrical conductivity and strength of ultrafine-grained copper containing deformation vacancies, alloying atoms and dislocations

Open School-Conference of NIS Countries Ultrafine Grained and Nanostructured Materials

Chembarisova, R.G.^1

Ufa State Aviation Technical University, 12 Karl Marx St., Ufa

450008, Russia^1

关键词: Cr alloys;    Electrical conductivity;    Impurity atoms;    Nanostructured Cu;    Ultrafine-grained copper;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/447/1/012085/pdf
DOI  :  10.1088/1757-899X/447/1/012085

来源: IOP

【 摘 要 】

The processes of electron scattering by crystal lattice defects such as vacancies, impurity atoms and dislocations are considered. The refined values of the sizes of the regions of interaction of electrons with the defects are obtained. The contribution of these defects to the resistivity and strength of the nanostructured Cu-0.5wt.% Cr alloy is estimated.