Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus

Scanning Probe Microscopy 2018

Dunaevskiy, M.S.^1 ; Alekseev, P.A.^1 ; Geydt, P.^2 ; Lahderanta, E.^2 ; Haggren, T.^3 ; Lipsanen, H.^3

Ioffe Institute, Saint-Petersburg

194021, Russia^1

Lappeenranta University of Technology, Lappeenranta

FI-53851, Finland^2

Aalto University, Espoo

FI-00076, Finland^3

关键词: Force control mode;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/443/1/012006/pdf
DOI  :  10.1088/1757-899X/443/1/012006

来源: IOP

【 摘 要 】

The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.