会议论文详细信息
2018 International Conference on Advanced Electronic Materials, Computers and Materials Engineering
Concentrated injection method for the improved sensitivity in detecting the decomposed products of SF6
材料科学;无线电电子学;计算机科学
Zhang, Long-Fei^1 ; Han, Fang-Yuan^1 ; Tang, Bin^1 ; Luo, Zong-Chang^1 ; Liu, Chen-Yao^1 ; Liang, Qin-Qin^1 ; Zhu, Li-Ping^1 ; Zhang, Jie-Ming^1
Electric Power Research Institute, Guangxi Power Grid Co. Ltd., Nanning, Guangxi
530023, China^1
关键词: Electrical equipment;    Gas chromatography-mass spectrometers;    Injection method;    Lower detection limit;    Peak intensity;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/439/2/022031/pdf
DOI  :  10.1088/1757-899X/439/2/022031
来源: IOP
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【 摘 要 】

A concentrated injection method for detecting SO2, H2S, SO2F2 and SOF2 in sulfur hexafluoride (SF6) based on Gas Chromatography-Mass Spectrometer (GC-MS) measurements has been proposed and developed. The peak intensity of the component obtained by concentrated injection method for detecting 1 μL/L SO2 was 20 times larger than that estimated by ordinary injection method, indicating a higher sensitivity, and a lower detection limit as well. This work shows advantages for the pre-warning of pitfall in electrical equipment, and effectively improves the safety and reliability of the grid.

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