会议论文详细信息
2018 5th International Conference on Advanced Composite Materials and Manufacturing Engineering
Preliminary Exploration of Instrument Control Technology
Zeng, Zhenjie^1 ; Zhu, Xiaofei^1 ; Qi, Shiju^1 ; Shen, Xiaowei^1 ; Cai, Shangjun^1
Rocket Force University of Engineering, Xi'an, China^1
关键词: Automated test systems;    Automatic test system;    Control methods;    Development platform;    Instrument control;    Instrument driver;    Key technologies;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/394/5/052064/pdf
DOI  :  10.1088/1757-899X/394/5/052064
来源: IOP
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【 摘 要 】

Instrument control technology is a key technology for building large-scale automated test systems. In order to construct a large-scale automatic test system more efficiently, the method of interconnecting and interoperating between a computer and an instrument and between an instrument and an instrument when constructing a system is discussed. The common bus for controlling the instrument is introduced. The establishment of the communication link, the control method of the instrument and the selection of the development platform are analysed. The characteristics and application occasions of the two instrument drivers are compared. Finally, several development principles that should be paid attention to when implementing a large-scale automatic test system to realize instrument control are summarized, which provide references for instrument control in large-scale automatic test systems.

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