Experimental Study and Matrix Effect Correction of Pseudobinary Samples in XRF Analysis

2018 2nd International Conference on Advanced Technologies in Manufacturing and Materials Engineering

Liu, Hefan^1 ; Zhou, Xiaoling^1 ; Zhang, Xin^1 ; Wu, Keyin^1 ; Lu, Chengwei^1

Chengdu Research Academy of Environmental Sciences, Chengdu, China^1

关键词: Calibration procedure;    Content measurements;    Correction method;    Influence coefficient;    Maximum absolute error;    Relative errors;    Si pin-detector;    X ray fluorescence analysis;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/389/1/012002/pdf
DOI  :  10.1088/1757-899X/389/1/012002

来源: IOP

【 摘 要 】

This basic study conducted an X-ray fluorescence (XRF) analysis on pseudo-binary samples, which emphasis on the binary influence coefficient and correction for matrix effects. The Ti-V, V-Ti, Ti-Fe, Fe-Ti, V-Fe and Fe-V samples were confected and measured by XRF analysis using a Si-PIN detector. These coefficients were calculated using mathematical models proposed through the Lachance-Traill algorithm, which can be applied in practice via an efficient calibration procedure. For the content measurement, the maximum absolute error decreased from 5.92% to 0.27%, and the relative error decreased from 14.84% to 0.66% via fitting correction for matrix effects. This study describes and emphasizes the application of the binary influence coefficient and fitting correction method.