Fabrication, Microstructure and Dielectric Properties of CaTi1-x (Ni1/3Nb2/3)xO3 Ceramics

4th Annual International Workshop on Materials Science and Engineering

Xi, Juan^1 ; Chen, Guohua^1

School of Materials Science and Engineering, Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin

541004, China^1

关键词: Annealing process;    F values;    Perovskite phase;    Sintered samples;    Sintering temperatures;    Solid state reaction method;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/381/1/012019/pdf
DOI  :  10.1088/1757-899X/381/1/012019

来源: IOP

【 摘 要 】

A series of CaTi1-x(Ni1/3Nb2/3)xO3(0.4.≤x≤0.6)ceramics were prepared through conventional solid-state reaction method. The effects of doping, sintering temperature and annealing process on the phase composition, microstructure and dielectric properties of CaTi1-x(Ni1/3Nb2/3)xO3 ceramics were investigated. The X-ray diffraction (XRD) and scanning electron microscope (SEM) analysis results indicated that all the sintered samples adopted single perovskite phase. As x increased o.4 to 0.6, r decreased from 59.52 to 44.97, Q×f values decreased from 13736 GHz to 6420 GHz, and the τf varied from +57.6 ppm/°C to -21.0 ppm/°C. A near zeroτf of -4.8 ppm/°C, dielectric contant of 47.3 and Q×f value of 11873.2 GHz were obtained at the sintering temperature of 1540 °C. Moreover, by annealing at 1400°C, the Q×f value was improved to 16130.6GHz.