Fatigue crack growth behaviour of semi-elliptical surface cracks for an API 5L X65 gas pipeline under tension

10th International Conference Numerical Analysis in Engineering

数学;工业技术

Shaari, M.S.^1 ; Akramin, M.R.M.^1 ; Ariffin, A.K.^1 ; Abdullah, S.^1 ; Kikuchi, M.^2

Department of Mechanical and Materials Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia, Bangi

43600, Malaysia^1

Tokyo University of Science, 2641 Yamazaki, Chiba, Noda

287-8510, Japan^2

关键词: Computation process;    Engineering problems;    Global geometries;    Numerical computations;    Overlay techniques;    Semi-elliptical surface cracks;    Stress intensity factor (SIF);    Virtual crack closure-integral methods;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/308/1/012041/pdf
DOI  :  10.1088/1757-899X/308/1/012041

学科分类：工业工程学

来源: IOP

【 摘 要 】

The paper is presenting the fatigue crack growth (FCG) behavior of semi-elliptical surface cracks for API X65 gas pipeline using S-version FEM. A method known as global-local overlay technique was used in this study to predict the fatigue behavior that involve of two separate meshes each specifically for global (geometry) and local (crack). The pre-post program was used to model the global geometry (coarser mesh) known as FAST including the material and boundary conditions. Hence, the local crack (finer mesh) will be defined the exact location and the mesh control accordingly. The local mesh was overlaid along with the global before the numerical computation taken place to solve the engineering problem. The stress intensity factors were computed using the virtual crack closure-integral method (VCCM). The most important results is the behavior of the fatigue crack growth, which contains the crack depth (a), crack length (c) and stress intensity factors (SIF). The correlation between the fatigue crack growth and the SIF shows a good growth for the crack depth (a) and dissimilar for the crack length (c) where stunned behavior was resulted. The S-version FEM will benefiting the user due to the overlay technique where it will shorten the computation process.