Exploring the limits of EDS microanalysis: rare earth element analyses

15th European Workshop on Modern Developments and Applications in Microbeam Analysis; 7th Meeting of the International union of Microbeam Analysis Societies

材料科学;物理学

Ritchie, N.W.M.^1 ; Newbury, D.E.^1 ; Lowers, H.^2 ; Mengason, M.^1

National Institute of Standards and Technology (NIST), Gaithersburg

MD

20899, United States^1

U.S. Geological Survey, Denver

CO

80225, United States^2

关键词: Accuracy and precision;    EDS microanalysis;    Energy dispersive x-ray spectrometries (EDS);    Low-energy;    Problem domain;    State of the art;    Trace element detection;    Wavelength-dispersive X-ray spectrometries;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/304/1/012013/pdf
DOI  :  10.1088/1757-899X/304/1/012013

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

It is a great time to be a microanalyst. After a few decades of incremental progress in energy-dispersive X-ray spectrometry (EDS), the last decade has seen the accuracy and precision surge forward. Today, the question is not whether EDS is generally useful but to identify the types of problems for which wavelength-dispersive X-ray spectrometry remains the better choice. The full extent of EDS's capabilities has surprised many. Low Z, low energy, and trace element detection have been demonstrated even in the presence of extreme peak interferences. In this paper, we will summarise the state-of-the-art and investigate a challenging problem domain, the analysis of minerals bearing multiple rare-earth elements.