会议论文详细信息
6th International Conference: Modern Technologies for Non-Destructive Testing | |
Feasibility of using T-shaped feedback in teraohmmeters | |
Yermoshin, N.I.^1 ; Yakimov, E.V.^1 | |
National Research Tomsk Polytechnic University, Tomsk, Russia^1 | |
关键词: Circuit parameter; Output voltages; Reference resistance; | |
Others : https://iopscience.iop.org/article/10.1088/1757-899X/289/1/012008/pdf DOI : 10.1088/1757-899X/289/1/012008 |
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来源: IOP | |
【 摘 要 】
The paper investigates the feasibility of using T-shaped feedback in teraohmmeters. Theoretical and experimental dependences of the output voltage of the T-shaped feedback converter on the measured resistance and circuit parameters are obtained. The use of T-shaped feedback is found to decrease the reference resistance rating from 10 GOhm to 100 Ohm that indicates 100-fold reduction (with an error of less than 1%).
【 预 览 】
Files | Size | Format | View |
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Feasibility of using T-shaped feedback in teraohmmeters | 312KB | download |