Feasibility of using T-shaped feedback in teraohmmeters

6th International Conference: Modern Technologies for Non-Destructive Testing

Yermoshin, N.I.^1 ; Yakimov, E.V.^1

National Research Tomsk Polytechnic University, Tomsk, Russia^1

关键词: Circuit parameter;    Output voltages;    Reference resistance;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/289/1/012008/pdf
DOI  :  10.1088/1757-899X/289/1/012008

来源: IOP

【 摘 要 】

The paper investigates the feasibility of using T-shaped feedback in teraohmmeters. Theoretical and experimental dependences of the output voltage of the T-shaped feedback converter on the measured resistance and circuit parameters are obtained. The use of T-shaped feedback is found to decrease the reference resistance rating from 10 GOhm to 100 Ohm that indicates 100-fold reduction (with an error of less than 1%).