Optomechanical coupling between AFM cantilever and semiconductor laser

Scanning Probe Microscopy 2017

Alekseev, P.A.^1 ; Sharov, V.A.^1 ; Mikhaylov, A.O.^1 ; Dunaevskii, M.S.^1 ; Baranov, A.^2

Ioffe Institute, Saint-Petersburg

194021, Russia^1

Institut d'Electronique du Sud, UM 2/CNRS, Montpellier

34095, France^2

关键词: AFM cantilevers;    Effective temperature;    Optomechanical;    Phase conversion;    Photothermal effects;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/256/1/012002/pdf
DOI  :  10.1088/1757-899X/256/1/012002

来源: IOP

【 摘 要 】

Optomechanical coupling between cantilever of the atomic force microscope (AFM) and a semiconductor laser was studied. When an AFM cantilever is oriented parallel to the surface of the emitting semiconductor laser, the system forms an optomechanical resonator. The optomechanical coupling due to photothermal effect was shown in room conditions. By optomechanical cooling the effective temperature of Si3N4cantilever was reduced down to 80 K. Amplitude-to-phase conversion in the studied cavity was demonstrated.