Lorentz microscopy methods for magnetic domain structure study

20th International Scientific Conference Reshetnev Readings-2016

Volochaev, M.N.^1,2 ; Kveglis, L.I.^3 ; Loginov, Yu Yu^2

Institute of Physics, Russian Academy of Sciences, Siberian Branch, Krasnoyarsk

660036, Russia^1

Reshetnev Siberian State University of Science and Technology, Krasnoyarsk

660014, Russia^2

Siberian Federal University, Krasnoyarsk

660041, Russia^3

关键词: Defocus;    Hitachi;    Lorentz microscopies;    Lorentz transmission electron microscopy;    Thin magnetic films;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/255/1/012015/pdf
DOI  :  10.1088/1757-899X/255/1/012015

来源: IOP

【 摘 要 】

The capabilities of transmission electron microscope Hitachi HT7700 for magnetic domain structure (MDS) study of thin films using Lorentz transmission electron microscopy (LTEM) methods is discussed. Two methods of magnetic domain structure study (defocus method and aperture shift method, including low-angle electron diffraction (LAED)) in thin magnetic films were examined.