Estimation of parameters of charge carriers in dielectric materials by CELIV method

International Scientific-technical Conference on Innovative Engineering Technologies, Equipment and Materials 2016

工业技术;机械制造;材料科学

Khafizov, I.I.^1 ; Saveleva, T.N.^1 ; Lyubtsov, V.S.^2

Kazan Federal University, 18 Kremlyovskaya street, Kazan

420008, Russia^1

Ufa State Aviation Technical University, Ufa, Russia^2

关键词: Celiv methods;    Electronic device;    Estimation of parameters;    Multi-layer thin film;    Polymer semiconductors;    Time of Flight methods;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/240/1/012040/pdf
DOI  :  10.1088/1757-899X/240/1/012040

来源: IOP

【 摘 要 】

Measuring the mobility of charge carriers by the time-of-flight method has been used for several decades to study organic semiconductors and dielectrics. Modern research in the field of polymer semiconductor devices focuses on the properties of single- and multi-layer thin-film structures with thicknesses less than 100 nm. Such structures are of considerable interest for research, since they are the basis for organic light-emitting diodes, organic solar cells and other electronic devices.