Development of Double Layer Microwave Absorber Using Genetic Algorithm

2017 International Conference on Advanced Technologies in Design, Mechanical and Aeronautical Engineering

工业技术;机械制造;航空航天工程

Kumar, Abhishek^1 ; Singh, Samarjit^1 ; Singh, Dharmendra^2

Department of Applied Mechanics, Motilal Nehru National Institute of Technology Allahabad, Allahabad, 211004, India^1

Department of Electronics and Communication, Indian Institute of Technology Roorkee, Roorkee, 247667, India^2

关键词: Coating thickness;    Complex permeability;    Complex permittivity;    Frequency dependent;    High frequency structure simulators (HFSS);    Microwave absorbers;    Microwave absorption characteristics;    Microwave absorption properties;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/234/1/012009/pdf
DOI  :  10.1088/1757-899X/234/1/012009

来源: IOP

【 摘 要 】

In this paper, an efficient two-layer microwave absorber at X-band is designed, optimized and implemented using the available materials with frequency dependent complex permittivity and complex permeability values as material database. The present work is focused on the design of a two-layer microwave absorber with good microwave absorption properties combined with broadband features at X-band. The optimization of various parameters such as materials, their sequence and thickness for obtaining better microwave absorption characteristics at X-band has been realized using Genetic Algorithm (GA). The optimized results were used to design a two-layer microwave absorber and experimentally tested using Attenuation Testing Device (ATD). Further verification of the experimentally obtained absorption results were simulated in High Frequency Structure Simulator (HFSS). The ATD result show that the maximum Reflection Loss (RL) for two-layer microwave absorber was -21.98 dB with 2.77 GHz bandwidth (corresponding to -10 dB) at 11.06 GHz for a total coating thickness of 1.5 mm.