会议论文详细信息
5th International Conference on Manufacturing, Optimization, Industrial and Material Engineering
REDUCTION OF DEFECTS IN JEWELRY MANUFACTURING
Ayudhya, Phitchaya Phanomwan Na^1 ; Tangjitsitcharoen, Somkiat^1
Department Industrial Engineering, Chulalongkorn University, Bangkok
10330, Thailand^1
关键词: Cause-and-Effect diagram;    Failure mode and effects analysis;    Manufacturing process;    Pareto diagrams;    Risk Priority Number;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/215/1/012016/pdf
DOI  :  10.1088/1757-899X/215/1/012016
来源: IOP
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【 摘 要 】

The aim of this research was to reduce the defects of gem bracelet found during manufacturing process at a jewelry company. It was found that gem bracelet product has the highest rejects compared to the rejects found in ring, earring, and pendant products. Types of defect were classified by using Pareto Diagram consisting of gem falling, seam, unclean casting, impinge, and deformation. The causes of defect were analyzed by Cause and Effect Diagram and applied Failure Mode and Effects Analysis (FMEA) was applied during manufacturing processes. This research found that the improvement of manufacturing process could reduce the Risk Priority Number (RPN) and total of all defects by 48.70% and 48.89%, respectively.

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