Characterization of UFG materials by X-ray and Neutron diffraction

7th International Conference on Nanomaterials by Severe Plastic Deformation

Ungár, T.^1,2 ; Ribárik, G.^1

Department of Materials Physics, Eötvös University, Budapest

H-1117, Hungary^1

Materials Performance Centre, School of Materials, University of Manchester, Manchester

M13 9PL, United Kingdom^2

关键词: Dislocation densities;    Dislocation type;    Dynamic property;    Intergranular strains;    Straight-forward method;    Submicron grains;    Substructure elements;    X-Ray and neutron diffraction;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/194/1/012003/pdf
DOI  :  10.1088/1757-899X/194/1/012003

来源: IOP

【 摘 要 】

Grain size, subgrain size, microstrain, dislocation density and dislocation types and intergranular strains determine the mechanical, chemical and other physical properties in materials of submicron grain size. Electron microscopy is a straightforward method to determine the substructure. X-ray and neutron diffraction methods supplement dynamic properties, especially strains and stresses and number densities of substructure elements. The synergy of electron microscopy and diffraction patterns provides a more comprehensive characterization of the substructure and a better understanding of the performance of ultra-fine-grain (UFG) materials.