X-ray Tomographic System Behavior Prediction Based on a Mathematical Model

5th International Conference: Modern Technologies For Non-Destructive Testing

材料科学;物理学

Baus, S.S.^1 ; Redko, L.A.^1 ; Yanushevskaya, M.N.^1

National Research Tomsk Polytechnic University, Tomsk, Russia^1

关键词: Design time;    Regression model;    Tomographic systems;    X ray intensity;    X ray radiation;    X-ray optical systems;    X-ray tomographs;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/189/1/012016/pdf
DOI  :  10.1088/1757-899X/189/1/012016

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.