Evaluation performance of digital integrated circuits while exposed to radiation

1st International Telecommunication Conference "Advanced Micro- and Nanoelectronic Systems and Technologies"

无线电电子学

Barbashov, V.M.^1 ; Trushkin, N.S.^1

National Research Nuclear University, MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, Moscow

115409, Russia^1

关键词: Digital machines;    Evaluation performance;    Exposed to;    Logical simulation;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/151/1/012011/pdf
DOI  :  10.1088/1757-899X/151/1/012011

来源: IOP

【 摘 要 】

The methods of functional-logical simulation of digital integrated circuits (ICs) exposed to radiation are observed. It is shown that in a number of cases functional and electrical deterioration of ICs performances have both deterministic and non-deterministic nature. Methods for simulating IC failure exposed to radiation based on the model of fuzzy digital machine and Brauer probabilistic reliability machine are proposed.