会议论文详细信息
International Conference on Advances in Materials and Manufacturing Applications 2016
Sensitizing The Multiple Damage Identification In Beam Structure Using Hoelder Exponent And Wavelets
Suresha, S.^1 ; Prakash, G Jaya^2 ; Reddy, D Mallikarjuna^3
Research Scholar, School of Mechanical Engineering, REVA University, Bangalore, Karnataka, India^1
FEA Engineer, Infosys India LTD, Bangalore, India^2
Assoct. Prof., School of Mechanical Engineering, VIT University, Vellore
Tamilnadu, India^3
关键词: Beam structures;    Continuous Wavelet Transform;    Damage Identification;    Damage identification algorithms;    Hoelder Exponent;    Local perturbation;    Multiple damages;    Spatial data;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/149/1/012153/pdf
DOI  :  10.1088/1757-899X/149/1/012153
来源: IOP
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【 摘 要 】

In case of damage identification using continuous wavelet transform, the damage is identified by sensing the local perturbations in the spatial signal. First, a damage identification algorithm based on continuous wavelet transform is presented in this paper and next the algorithm is verified using a numerical beam model with different simulated damage cases. Multiple location damage cases are studied for damage identification. The effect of using only damaged data (mode shape from damaged beam) is investigated and compared. Another method of simultaneously detecting, locating and quantifying damage in a single graph is to plot the Hoelder exponent along the beam length. At each discrete point (node number) of beam, the Hoelder exponent is estimated and the resulting values are plotted along the length of beam. Any sudden variation of the exponent at a particular region, provide information on possibility of damage and the minimum value of exponent at that region gives the damage severity.

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