Investigation of phases and textures of binary V-Si coating deposited on vanadium-based alloy (V-4Cr-4Ti) using electron backscatter diffraction

17th International Conference on Textures of Materials

材料科学;物理学

Nowakowski, P.^1 ; Ubhi, H.S.^2 ; Mathieu, S.^3

Oxford Instruments, Gometz La Ville, France^1

Oxford Instruments, High Wycombe, United Kingdom^2

Université de Lorraine, Institut Jean Lamour, Vandoeuvre-lès-Nancy, France^3

关键词: Alloy substrates;    Barrier coatings;    Electron back scatter diffraction;    Growth textures;    Micro-structure evolutions;    Multi-layered coatings;    Orientation relationship;    X-ray energy dispersive spectrometry;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/82/1/012061/pdf
DOI  :  10.1088/1757-899X/82/1/012061

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Barrier coating consisting of binary silicide compounds SixVywere deposited on a V-4Cr-4Ti vanadium alloy substrate. Samples were cycled in a furnace for 122h at 650°C and 1100°C. The electron backscattered (EBSD) combine with X-ray energy dispersive spectrometry (EDS) techniques were employed to identify the phases in the multi-layered coating and to determine growth texture for each phase. The microstructure evolutions occurringduring cycling at 1100°C in the protective coating and the crystal orientation relationships between SixVywere determined.