会议论文详细信息
4th Global Conference on Materials Science and Engineering
3D X-rays application for precision measurement of the cell structure of extruded polystyrene
Lim, J.Y.^1 ; Kim, K.Y.^2 ; Shin, H.S.^2 ; Yeom, S.^2 ; Lee, S.E.^1
Building and Urban Research Institute, Korea Institute of Civil Engineering and Building Technology, Korea, Republic of^1
Geo-technical Engineering Research Institute, Korea Institute of Civil Engineering and Building Technology, Korea, Republic of^2
关键词: 3D cell structures;    Cell size distribution;    Current technology;    Diameter distributions;    Extruded polystyrenes;    Insulation materials;    Precision measurement;    Thermal Performance;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/103/1/012019/pdf
DOI  :  10.1088/1757-899X/103/1/012019
来源: IOP
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【 摘 要 】

While the thermal performance of existing insulation materials have been determined by blister gases, the thermal performance of future insulation materials will be dependent on the cell size and independent foam content as we use eco-friendly blister gases with a higher thermal conductivity. However, with the current technology we are only able to guess the whole cell size and independent foam content through SEM applied 2D fragmentary scanning but are still far from the level of accurate cell structure data extraction. Under this situation, we utilized X-ray CT scanned 3D images to identify and shape the cell structure and proposed a method of inferring the whole distribution and independent foam content as accurately as possible. According to X-ray CT scanning images and SEM images, the shape was similar but according to tracer applied CT scanning images, the cell size distribution was 380∼400 μm within the range of the general insulation diameter distribution which had the highest reliability. As for extrusion foaming polystyrene, we need additional image processing to identify the independent foam content as its density is too low. So, it is recommended to raise the 3D cell structure completeness of XPS by improving the scanning accuracy.

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