On the atomic force microscopy characterization of void evolution in severely plastic deformed pure iron

6th International Conference on Nanomaterials by Severe Plastic Deformation

材料科学;化学

Forouzanmehr, N.^1 ; Nili-Ahmadabadi, N.^1

School of Metallurgy and Materials Engineering, University of Tehran, Iran^1

关键词: Atomic-scale resolution;    Characterization tools;    Deformed samples;    Nano-structured;    Nanocrystallines;    Severe plastic deformations;    Submicrometers;    Void evolution;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/63/1/012149/pdf
DOI  :  10.1088/1757-899X/63/1/012149

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Different severe plastic deformation comprise equal channel angular pressing (ECAP), shaped cold rolling and drawing, or combined were applied on pure iron to obtain nano structured grains. The results show the formation of high concentration of excess free volume up to about 4% in the cold rolled and drawn specimens. Emphasis has been placed on atomic force microscopy (AFM) observations as additional characterization tools that complement the information provided by other techniques. Since the surface of the materials can be observed with atomic-scale resolution, the AFM is a powerful technique to study porous materials. The microscopy observations detect voids in the nanocrystalline Fe sample- processed by shaped rolling followed by drawing with applied true strain of 7- from nano to sub-micrometer in size. It seems that the coalescence of nanovoids could lead to the formation of micro-voids in the structure of deformed samples.