| 6th International Scientific Practical Conference on Innovative Technologies and Economics in Engineering | |
| Fatigue life of silumin irradiated by high intensity pulsed electron beam | |
| 工业技术;经济学 | |
| Konovalov, S.V.^1,2 ; Alsaraeva, K.V.^1 ; Gromov, V.E.^1 ; Ivanov, Yu F^3,4 | |
| Siberian State Industrial University, Kirov str. 42, Novokuznetsk | |
| 654007, Russia^1 | |
| Wenzhou University, Wenzhou, Zhejiang Province | |
| 325035, China^2 | |
| Institute of High Current Electronics Siberian Branch, Russian Academy of Science, 2/1 Akademicheskii av., Lenin str. 30, Tomsk | |
| 634021, Russia^3 | |
| National Research Tomsk State University, Tomsk | |
| 634050, Russia^4 | |
| 关键词: Electron beam processing; Electron-beam treatment; Evolution of structures; Fatigue service life; Multiphase materials; Pulsed electron beams; Scanning electrons; Stress concentrators; | |
| Others : https://iopscience.iop.org/article/10.1088/1757-899X/91/1/012029/pdf DOI : 10.1088/1757-899X/91/1/012029 |
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| 学科分类:工业工程学 | |
| 来源: IOP | |
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【 摘 要 】
The electron-beam processing of silumin, leading to the evolution of structure-phase state of its surface is carried out. It has been shown that this alloy is a multiphase material and contains, except an aluminum-based phase, the particles of intermetallic compounds of Al-Si- Fe-Mn. It is shown that electron beam treatment of the eutectic silumin surface increases the fatigue service life more than in 3.5 times. The analysis of structure-phase states modification of silumin subjected to electron beam treatment with the following fatigue loading up to the failure is carried out by methods of optical and scanning electron diffraction microscopy. Analysis of the surface layer structure revealed the sources of nucleation of submicrocracks. It is revealed that the large silicon plates located on the surface and in the subsurface layer are the most dangerous stress concentrators.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| Fatigue life of silumin irradiated by high intensity pulsed electron beam | 990KB |
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