Conductive, magnetic and structural properties of multilayer films

2nd International Conference on Competitive Materials and Technological Processes

Kotov, L.N.^1 ; Turkov, V.K.^1 ; Vlasov, V.S.^1 ; Lasek, M.P.^1 ; Kalinin, Yu E.^2 ; Sitnikov, A.V.^2

Department of Radio Physics and Electronics, Syktyvkar State University, 167001 Syktyvkar, Russia^1

Department of Solid State Physics, Voronezh State Technical University, 394026 Voronezh, Russia^2

关键词: Composite dielectrics;    Ferromagnetic resonance (FMR);    Hydrogen atmosphere;    Ion beam sputtering methods;    Magnetic interactions;    Phase concentration;    Specific electric resistance;    Surface reliefs;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/47/1/012027/pdf
DOI  :  10.1088/1757-899X/47/1/012027

来源: IOP

【 摘 要 】

Composite-semiconductor and composite-dielectric multilayer films were obtained by the ion beam sputtering method in the argon and hydrogen atmospheres with compositions: {[(Co45-Fe45-Zr10)x(Al2O3)y]-[α-Si]}120, {[(Co45-Ta45-Nb10)x(SiO2)y]-[SiO2]}56, {[(Co45-Fe45-Zr10)x(Al2O3)y]-[α-Si:H]}120. The images of surface relief and distribution of the dc current on composite layer surface were obtained with using of atomic force microscopy (AFM). The dependencies of specific electric resistance, ferromagnetic resonance (FMR) fields and width of line on metal (magnetic) phase concentration x and nanolayers thickness of multilayer films were obtained. The characteristics of FMR depend on magnetic interaction among magnetic granules in the composite layers and between the layers. These characteristics depend on the thickness of composite and dielectric or semiconductor nanolayers. The dependences of electric microwave losses on the x and alternating field frequency were investigated.