Electron impact secondary electron emissions from atomic and molecular solid targets

30th International Conference on Photonic, Electronic, and Atomic Collisions

Haque, A.K.F.^1 ; Uddin, M.A.^1 ; Basak, A.K.^1 ; Saha, B.C.^2 ; Maaza, M.^3 ; Patoary, M.A.R.^1 ; Haque, M.M.^1 ; Ismail Hossain, M.^1

Department of Physics, University of Rajshahi, Rajshahi

6205, Bangladesh^1

Department of Physics, Florida A and M University, Tallahassee

FL

32307, United States^2

University of South Africa (UNISA), Muckleneuk Ridge, PO Box392, Pretoria, South Africa^3

关键词: Atomic electron;    Effective charge;    Effective mean excitation energy;    Electron impact;    Incident electrons;    Incident energy;    Secondary electron emissions;    Secondary electron yield;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/8/072001/pdf
DOI  :  10.1088/1742-6596/875/8/072001

来源: IOP

【 摘 要 】

Synopsis The Sternglass theory [Sternglass, Phys. Rev. 108, (1957) 1] for fast-ion-induced secondary electron emission, which is proportional to the stopping powers, has been modified to calculate the electron impact secondary electron yield from both elemental and compound targets with atomic number Z = 4 - 92 for incident energy range 5 ≤ Ei≤ 105eV. This modification includes the use of a realistic stopping power expression that involves calculations of the effective atomic electron number, effective mean excitation energies and realistic electron density distribution of the target atoms along with the effective charge of incident electron.