Dissociation dynamics of transient anion formed via electron attachment to sulphur dioxide (SO2)

30th International Conference on Photonic, Electronic, and Atomic Collisions

Gope, Krishnendu^1 ; Prabhudesai, Vaibhav S.^1 ; Mason, Nigel J.^2 ; Krishnakumar, E.^1

Dept. Nuclear and Atomic Physics, Tata Institute of Fundamental Research, Colaba, Mumbai

400005, India^1

Dept. of Physical Sciences, Open University, Walton Hall, Milton Keynes

MK7 6AA, United Kingdom^2

关键词: Dissociation dynamics;    Dissociative electron attachment;    Electron attachment;    Parent anions;    Velocity slice imaging;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/7/062030/pdf
DOI  :  10.1088/1742-6596/875/7/062030

来源: IOP

【 摘 要 】

Synopsis: We have investigated the dynamics of dissociative electron attachment to sulfur dioxide (SO2) using velocity slice imaging (VSI) technique. The symmetric dissociation of the transient parent anion results in S-formation whereas its asymmetric dissociation results in the O-and SO-channels. We clearly see the competition between bending and stretch mode of vibrations of the parent anions in S-formation whereas the stretch modes dominate in the other two ions production.