Prominent role of indirect processes in electron-impact ionization of Xe24+ ions

30th International Conference on Photonic, Electronic, and Atomic Collisions

Liu, P.^1 ; Zeng, J.^1,2 ; Borovik, A.^3,4 ; Schippers, S.^3 ; Müller, A.^4

Department of Physics, College of Science, National University of Defense Technology, Changsha Hunan, China^1

IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai, China^2

Institut für Atom- und Molekülphysik, Justus-Liebig-Universität Gießen, Giessen

35392, Germany^3

I. Physikalisches Institut, Justus-Liebig-Universität Gießen, Giessen

35392, Germany^4

关键词: Double autoionization;    Electron impact-ionization;    Indirect process;    Principal quantum numbers;    Resonant excitation;    Resonant ionization;    Single ionization;    Theoretical calculations;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/6/052048/pdf
DOI  :  10.1088/1742-6596/875/6/052048

来源: IOP

【 摘 要 】

Synopsis The cross section for electron-impact single ionization of Xe24+has been studied both experimentally and theoretically. The cross section exhibits significant features from resonant ionization processes such as resonant-excitation double autoionization. These are well described by the theoretical calculations if the latter take into account excitations to atomic shells with principal quantum numbers of up to n = 39.