Measurement of low cross section transition using versatile absorption technique

30th International Conference on Photonic, Electronic, and Atomic Collisions

Sharma, Gaurav^1 ; Nandi, T.^2 ; Puri, Nitin K.^2

Dept. of Applied Physics, Delhi Technological University, New Delhi

110042, India^1

Inter University Accelerator Centre, New Delhi

110067, India^2

关键词: Beam-foil;    Detector resolution;    High intensity;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/5/042009/pdf
DOI  :  10.1088/1742-6596/875/5/042009

来源: IOP

【 摘 要 】

Synopsis The various possibilities of the X-ray absorption spectroscopy is explored in a beam foil experiment. The technique is used for the successful detection of a low cross section process and enhancing the detector resolution which gets degraded due to high intensity ratio. The lifetime measured with the technique matches with the value when absorber is not used.