Sideband and streaking regimes in two-color photoionization by twisted X-waves in strong infrared fields

30th International Conference on Photonic, Electronic, and Atomic Collisions

Böning, B.^1 ; Paufler, W.^1 ; Fritzsche, S.^1,2

Theoretisch-Physikalisches Institut, Friedrich-Schiller-Universität Jena, Jena

D-07743, Germany^1

Helmholtz-Institut Jena, Fröbelstieg 3, Jena

D-07743, Germany^2

关键词: Infrared beams;    Infrared field;    Pulse durations;    S-matrix;    Two-color;    X waves;    XUV pulse;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/3/022017/pdf
DOI  :  10.1088/1742-6596/875/3/022017

来源: IOP

【 摘 要 】

Synopsis The photoionization by short twisted XUV pulses (X-waves) is investigated in the presence of an intense infrared beam within the S-matrix formalism. It is demonstrated how sidebands are affected by the twist of the ionizing pulse as the pulse duration increases.