Reconstruction of sub-femtosecond longitudinal bunch profile measurement data

8th International Particle Accelerator Conference

Weikum, M.K.^1,2 ; Andonian, G.^3,4 ; Assmann, R.W.^1 ; Dorda, U.^1 ; Sheng, Z.M.^2,5

Deutsches Elektronensynchrotron (DESY), Hamburg

22607, Germany^1

SUPA, Department of Physics, University of Strathclyde, Glasgow

G4 0NG, United Kingdom^2

RadiaBeam Technologies, LLC, Santa Monica

CA

90404, United States^3

Department of Physics and Astronomy, UCLA, Los Angeles

CA

90095, United States^4

Laboratory of Laser Plasmas, Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai

200240, China^5

关键词: Accelerated electron beam;    Attosecond resolution;    Beam profiles;    Femtoseconds;    Profile measurement;    Vertical direction;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/874/1/012079/pdf
DOI  :  10.1088/1742-6596/874/1/012079

来源: IOP

【 摘 要 】

With a current trend towards shorter electron beams with lengths on the order of few femtoseconds (fs) to sub-femtoseconds both in conventional and novel accelerator communities, the need for diagnostics with equivalent attosecond resolution is increasing. The proposed design for a sub-femtosecond diagnostic by Andonian et al. (2011, Phys. Rev. ST Accel. Beams 14 072802) is one such example that combines a laser deflector with an RF deflecting cavity to streak the electron beam in the horizontal and vertical direction. In this paper, we present a tool for the reconstruction of the longitudinal beam profile from this diagnostic data, which can be used both for the analysis of planned experiments and testing of different beam scenarios with respect to their specific setup requirements. Applying this method, the usefulness of the device for measurements in a number of example scenarios, including plasma-accelerated and ultrashort RF-accelerated electron beams, is discussed.