会议论文详细信息
International Conference on Polarised Neutrons for Condensed Matter Investigations
Neutron Larmor diffraction with double and single precession arm
Van Well, A.A.^1 ; Rekveldt, M.T.^1
Department of Radiation Science and Technology, Faculty Applied Sciences, Delft University of Technology, Delft
2629JB, Netherlands^1
关键词: Applied magnetic fields;    High resolution;    Lattice spacing;    Neutron diffraction technique;    Polycrystalline samples;    Sample environment;    Scattering angles;    Tilt angle;   
Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/862/1/012029/pdf
DOI  :  10.1088/1742-6596/862/1/012029
来源: IOP
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【 摘 要 】
A review is given of double and single arm Larmor diffraction. With the former a lattice-spacing resolution down to 10-6can be obtained. The latter is a good high-resolution alternative if the sample or sample environment disturbs the magnetic field, e.g. ferromagnetic samples or applied magnetic fields. By choosing the tilt angle of the precession fields the optimum resolution can be set at a scattering angle at choice. The resolution for both single-crystal and polycrystalline samples is discussed in depth and is compared with conventional neutron-diffraction techniques.
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