In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy

X-Ray Microscopy Conference 2016

Rösner, Benedikt^1,3 ; Schmidt, Ute^2 ; Fink, Rainer H.^1

Department Chemie und Pharmazie, ICMM, Friedrich-Alexander-Universitat Erlangen-Nürnberg (FAU), Egerlandstr. 3, Erlangen

91058, Germany^1

WITec GmbH, Lise-Meitner-Str. 6, Ulm

89081, Germany^2

Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, Villigen PSI

5232, Switzerland^3

关键词: Applied voltages;    In-operando studies;    Micro spectroscopy;    Negatively charged;    Neutral fractions;    Organic components;    Raman microspectroscopy;    Soft-X-ray absorption;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012016/pdf
DOI  :  10.1088/1742-6596/849/1/012016

来源: IOP

【 摘 要 】

We characterize individual Ag-TCNQ nanocrystals during switching their resistivity state in operando. Raman and soft X-ray absorption microspectroscopy are employed to disclose the electronic state of the organic component in dependency of applied voltage. Whereas Raman microspectroscopy offers qualitative insight into the conversion of negatively charged TCNQ molecules to their neutral counterpart, quantification of the neutral fraction can be achieved using X-ray absorption spectroscopy. These results allow a detailed investigation of resistivity switching in electrically bistable Ag-TCNQ nanocrystals.