Scanning tunneling microscopy of a graphene layer placed on a micro structured substrate

18th Russian Youth Conference on Physics of Semiconductors and Nanostructures, Opto- and Nanoelectronics

Sh Ganbarova, T.^1 ; Babichev, A.V.^2,3 ; Rykov, S.A.^1

Peter the Great Polytechnic University, 29 Politekhnicheskaya Str., St. Petersburg

195251, Russia^1

Academic University RAS, 8/3 Khlopina Str., St.Petersburg

194021, Russia^2

ITMO University, 49 Kronverkskiy Prosp., St. Petersburg

197101, Russia^3

关键词: Electron energy spectrum;    Graphene layers;    Mechanical stress;    Space between;    Structured substrate;    Test structure;    Tunneling spectroscopy;    Two-dimensional arrays;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/816/1/012032/pdf
DOI  :  10.1088/1742-6596/816/1/012032

来源: IOP

【 摘 要 】

The features of the surface topography and the local energy spectrum of the graphene layer placed on a two-dimensional array of GaN pyramids are studied using scanning tunneling microscopy and local tunneling spectroscopy. This structure can be used as a test structure for the application of graphene as a flexible conductive transparent electrode in optoelectronics. Sagging of a graphene layer in the space between pyramids is found and the sagging value is estimated to be about 20% of the pyramid height of 1.1 μm. Local energy spectra show the change of the graphene electron energy spectrum due to the mechanical stress at sagging.