Modeling X-ray Line Shapes from Asphaltenes

23rd International Conference on Spectral Line Shapes

Alqahtani, H.^1 ; Courtenay Lewis, J.^1 ; Shirokoff, J.^2

Department of Physics and Physical Oceanography, Canada^1

Department of Process Engineering, Memorial University of Newfoundland, St. John's

NL

A1B 3X7, Canada^2

关键词: K-alpha radiation;    Mathematica;    Scan rates;    Structural studies;    Voigt profile;    X-ray lines;    XRD spectra;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/810/1/012049/pdf
DOI  :  10.1088/1742-6596/810/1/012049

来源: IOP

【 摘 要 】

Structural studies of asphaltene in crude oil have been performed by x-ray diffraction (XRD). The XRD spectra were taken with a Rigaku Dmax 2200V/PC, and built-in Jade™ software was used for initial analysis. XRD was performed with Cu-K-α radiation operating at 40 KV and 40 mA, with a scan rate of 0.001° 2θ per second. The XRD data were first fitted with Pearson VII profiles and then with pseudo-Voigt profiles, and then modeled in Mathematica