TXRF spectrometry at ion beam excitation

3rd International Conference on X-ray Technique

Egorov, V.^1 ; Egorov, E.^1 ; Afanas'Ef, M.^2

Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences (IMT RAS), Chernogolovka, Moscow Distr.

142432, Russia^1

Institute of Radio-engineering and Electronics, Russian Academy of Sciences (IRE RAS), Moscow

125009, Russia^2

关键词: Experimental scheme;    Ion beam excitations;    New experimental method;    PIXE methods;    Real measurements;    TXRF spectrometry;    X-ray waveguides;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/808/1/012002/pdf
DOI  :  10.1088/1742-6596/808/1/012002

来源: IOP

【 摘 要 】

The work presents short discussion of TXRF and PIXE methods peculiarities. Taking into account of these peculiarities we elaborate the experimental scheme for TXRF measurements at ion beam excitation of characteristical fluorescence. The scheme is built on base of the planar X-ray waveguide-resonator with specific design. Features of the new experimental method and possibilities of Sokol-3 ion beam analytical complex were used for the method application in real measurements.