Characterization of YbNi4(P1_xAsx)2, x = 0, 0.2 single crystals grown by Czochralski method

International Conference on Strongly Correlated Electron Systems 2016

Kliemt, K.^1 ; Krellner, C.^1

Institute of Physics, Goethe-University Frankfurt, Max-von-Laue Stasse 1, Frankfurt

60438, Germany^1

关键词: Absolute values;    As distribution;    Homogenity;    Nonmagnetics;    Phase pure;    Polycrystalline samples;    Substituted compounds;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/807/3/032005/pdf
DOI  :  10.1088/1742-6596/807/3/032005

来源: IOP

【 摘 要 】

We have investigated large single crystals of YbNi4P2that were grown from a levitating melt by the Czochralski method. The new samples facilitate the determination of the absolute values of the electrical resistivity. Phase pure polycrystalline samples of the non-magnetic reference LuNi4P2were prepared and the electrical resistivity was measured. Furthermore we have grown a single crystal of the As substituted compound YbNi4(P1-xAsx)2, x = 0.2 and investigated the homogenity of the As distribution.