Structural and morphological characterization of ternary nanocrystalline Cu-In-S thin films prepared by laser ablation

19th International School on Condensed Matter Physics: Advances in Nanostructured Condensed Matter: Research and Innovations

Bineva, I.^1 ; Pejova, B.^2,3 ; Mihailov, V.^1 ; Dinescu, A.^4 ; Danila, M.^4 ; Karatodorov, S.^1

Institute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee Blvd., Sofia

1784, Bulgaria^1

Institute of Chemistry, Faculty of Natural Sciences and Mathematics, Ss. Cyril and Methodius University, POB 162, Skopje

1000, Macedonia^2

Research Center for Environment and Materials, Macedonian Academy of Sciences and Arts, Krste Misirkov 2, Skopje

1000, Macedonia^3

National Institute for RandD in Microtechnologies-IMT Bucharest, 126 Erou Iancu Nicolae Str., Bucharest

077190, Romania^4

关键词: Deposition time;    Laser-pulse energy;    Morphological characterization;    Nanocrystalline Cu;    Nanocrystallines;    Root mean square roughness;    Si (100) substrate;    Structure and morphology;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/794/1/012019/pdf
DOI  :  10.1088/1742-6596/794/1/012019

来源: IOP

【 摘 要 】

Thin nanocrystalline Cu-In-S films are prepared by pulsed laser ablation in vacuum with Nd:YAG laser operating at 1064 nm on Si (100) substrates. As a target, a CuInS2quantum dots powder, synthesized by sonochemical template-free colloidal approach and pressed to form a pellet is used. The structure and morphology of the deposited films were studied employing X-ray diffraction, scanning electron microscopy, and atomic force microscopy techniques. The analysis of the deposited thin films revealed predominant cubic Cu1.7In0.05S phase. It has been found that deposited films were nanocrystalline. The effect of laser pulse energy and deposition time on the structure and morphology of as-prepared films is studied. Slight mean diameter increase from 8 nm to 13 nm with deposition time and applied power was observed, as the time dependence is more pronounced. On the contrary, six fold increase from 7.4 to 44.3 nm of the surface root mean square roughness was estimated with augmentation of the applied laser pulse energy.