Calibrating a point diffraction interferometer using aspherical wavefront reference.

8th International Congress of Engineering Physics

物理学;工业技术

Castán-Ricaño, D.^1 ; Granados-Agustín, Fermín S.^1 ; Percino-Zacarías, E.^1 ; Tecuatl-Tecuatl, P.^1 ; Cornejo-Rodríguez, A.^1

Instituto Nacional de Astrofísica, Optica y Electrónica, Apdo. Postal 216, Puebla, Pue.

C.P. 72000, Mexico^1

关键词: Aspherical;    Convex aspheric surfaces;    Point diffraction interferometer;    Quantitative evaluation;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/792/1/012090/pdf
DOI  :  10.1088/1742-6596/792/1/012090

学科分类：工业工程学

来源: IOP

【 摘 要 】

This work presents a method to calibrate the reference wavefront generated by an IDP. This wavefront is considered for quantitative evaluation of a plano-convex aspheric surface. Preliminary experimental results are presented.